Zeiss LSM 780
Zeiss LSM 780
We are excited to announce the addition of a Zeiss LSM 780 confocal laser scanning microscope to the HRMC! This is a sate-of-the-art inverted microscope capable of exciting of all existing visible fluorophores. The scan resolution supported goes up to 6144 × 6144 pixels, and supports free rotation (360 degrees), in steps of 1 degree and free xy offset. The scanning module also allows scan zooms up to 40X, and scan speeds of up to 4000 lines per second, with 250 frames/sec possible with a 512 × 16 pixel frame. The microscope is equipped with a motorized XYZ-scanning stage with 1um XY-resolution and 25nm Z-resolution. The system is equipped with 5 different detectors, 2 standard PMT detectors, 2 GaAsP detectors (with twice the standard quantum efficiency of PMTs), and one 34-channel Spectral Detector array (comprised of 2 PMTs and 32 GaAsP detectors). The system software includes the FRAP Analysis Module for fluorescence recovery after photobleaching; the Tiles & Positions Module for stitching large scan areas and imaging multi-well plates; and a Metrology Module for confocal topographic analysis.
Lenses:
10x / 0.30NA
20x / 0.70NA DIC
20x / 0.80NA
40x / 1.20NA Water
63x / 1.40NA Oil
Laser Lines:
405, 458, 488, 514, 561,
594, 633
Detectors:
2 Standard PMTs
2 GaAsP
1 Quasar Spectral Detector
Spectral Imaging
The LSM 780 confocal is equipped with Zeiss' groundbreaking Quasar spectral detector. The Quasar is a 32-channel detector array that works seamlessly separate the different fluorescent signals within your samples. For example, the Quasar detector can distinguish between different overlapping fluorophores, or remove autofluorescence in living samples. The video on the left shows live imaging of plant cells, with the separated spectra shown in different colors -- this cannot be done with conventional microscopy.
​
Read More:
Live time-lapse imaging of M. polymorpha thallus cells: actin filaments (green), endoplasmic reticulum (magenta), MitoTracker Orange (yellow), and chlorophyll autofluorescence (blue).
Surface Analysis
The Metrology Module of the LSM 780 is capable of advanced texture analysis of topographies, and enables precise, three-dimensional imaging and of nanomaterials, metals, polymers, and semiconductors. Guided Workflows reduce set-up times and speed up your time-to-result by performing analyses and imaging without having to change microscopes. The module is perfect for the analysis of surface roughness.